Origin of preferential grain orientation in excimer laser-induced crystallization of silicon thin films

  • M. Weizman, C. Klimm, N. H. Nickel, B. Rech
  • Applied Physics Letters, April 2012, American Institute of Physics
  • DOI: 10.1063/1.4704559

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http://dx.doi.org/10.1063/1.4704559

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