Publisher’s Note: “In situ analysis of elemental depth distributions in thin films by combined evaluation of synchrotron x ray fluorescence and diffraction” [J. Appl. Phys. 109, 123515 (2011)]

R. Mainz, R. Klenk
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.3703073
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