Reliability improvement of InGaZnO thin film transistors encapsulated under nitrogen ambient

  • Chun-Yu Wu, Huang-Chung Cheng, Chao-Lung Wang, Ta-Chuan Liao, Po-Chun Chiu, Chih-Hung Tsai, Chun-Hsiang Fang, Chung-Chun Lee
  • Applied Physics Letters, April 2012, American Institute of Physics
  • DOI: 10.1063/1.3702794

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http://dx.doi.org/10.1063/1.3702794

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