Experimental and theoretical analysis of the temperature dependence of the two-dimensional electron mobility in a strained Si quantum well

Takahisa Tanaka, Go Tsuchiya, Yusuke Hoshi, Kentarou Sawano, Yasuhiro Shiraki, Kohei M. Itoh
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.3702464
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