Tuning minority-carrier lifetime through stacking fault defects: The case of polytypic SiC

  • Bin Chen, Hirofumi Matsuhata, Takashi Sekiguchi, Akimasa Kinoshita, Kyouichi Ichinoseki, Hajime Okumura
  • Applied Physics Letters, March 2012, American Institute of Physics
  • DOI: 10.1063/1.3700963

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http://dx.doi.org/10.1063/1.3700963

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