Effect of TaOx thickness on the resistive switching of Ta/Pr0.7Ca0.3MnO3/Pt films

  • Ziyu Liu, Peijian Zhang, Yang Meng, Huanfang Tian, Jianqi Li, Xinyu Pan, Xuejin Liang, Dongmin Chen, Hongwu Zhao
  • Applied Physics Letters, April 2012, American Institute of Physics
  • DOI: 10.1063/1.3700806

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http://dx.doi.org/10.1063/1.3700806

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