Effects of high temperature annealing on single crystal ZnO and ZnO devices

W. Mtangi, F. D. Auret, M. Diale, W. E. Meyer, A. Chawanda, H. de Meyer, P. J. Janse van Rensburg, J. M. Nel
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.3700186