On the electrical conductivity of Ti-implanted alumina

M. C. Salvadori, F. S. Teixeira, M. Cattani, A. Nikolaev, K. P. Savkin, E. M. Oks, H.-K. Park, L. Phillips, K. M. Yu, I. G. Brown
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.3697900
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