Tailoring interfacial exchange coupling with low-energy ion beam bombardment: Tuning the interface roughness

K.-W. Lin, M. Mirza, C. Shueh, H.-R. Huang, H.-F. Hsu, J. van Lierop
  • Applied Physics Letters, January 2012, American Institute of Physics
  • DOI: 10.1063/1.3697405
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