Electrical characterization of back-gated bi-layer MoS2 field-effect transistors and the effect of ambient on their performances

Hao Qiu, Lijia Pan, Zongni Yao, Junjie Li, Yi Shi, Xinran Wang
  • Applied Physics Letters, January 2012, American Institute of Physics
  • DOI: 10.1063/1.3696045
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