High resolution imaging of few-layer graphene

O. Albrektsen, R. L. Eriksen, S. M. Novikov, D. Schall, M. Karl, S. I. Bozhevolnyi, A. C. Simonsen
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.3694660
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