Improved AC conductance and Gray-Brown methods to characterize fast and slow traps in Ge metal–oxide–semiconductor capacitors

Xiao Sun, Clement Merckling, Guy Brammertz, Dennis Lin, Johan Dekoster, Sharon Cui, T. P. Ma
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.3691898
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