Publisher’s Note: “Effect of nickel contamination on high carrier lifetime n-type crystalline silicon” [J. Appl. Phys. 111, 033702 (2012)]

Jinwoo Kim, Young-Woo Ok, Prashant Kulshreshtha, Steve Johnston, George Rozgonyi, Yohan Yoon, Bijaya Paudyal
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.3689822