Negative-bias-temperature-instability and hot carrier effects in nanowire junctionless p-channel multigate transistors

  • Jong Tae Park, Jin Young Kim, Jean Pierre Colinge
  • Applied Physics Letters, February 2012, American Institute of Physics
  • DOI: 10.1063/1.3688245

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http://dx.doi.org/10.1063/1.3688245

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