Temperature effect on electrical characteristics of negative capacitance ferroelectric field-effect transistors

Y. G. Xiao, M. H. Tang, J. C. Li, C. P. Cheng, B. Jiang, H. Q. Cai, Z. H. Tang, X. S. Lv, X. C. Gu
  • Applied Physics Letters, January 2012, American Institute of Physics
  • DOI: 10.1063/1.3688046