Structural study of GaP layers on misoriented silicon (001) substrates by transverse scan analysis

H. Jussila, S. Nagarajan, T. Huhtio, H. Lipsanen, T. O. Tuomi, M. Sopanen
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.3686711