Low operation voltage and high thermal stability of a WSi2 nanocrystal memory device using an Al2O3/HfO2/Al2O3 tunnel layer

Dong Uk Lee, Hyo Jun Lee, Eun Kyu Kim, Hee-Wook You, Won-Ju Cho
  • Applied Physics Letters, January 2012, American Institute of Physics
  • DOI: 10.1063/1.3684967
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