X-ray diffraction, dielectric, conduction and Raman studies in Na0.925Bi0.075Nb0.925Mn0.075O3 ceramic

Chiheb Chaker, Y. Gagou, N. Abdelmoula, J.-L. Dellis, C. Masquelier, H. Khemakhem, M. El Marssi
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.3684961