Variable range hopping in TiO2 insulating layers for oxide electronic devices

Ariando, Y. L. Zhao, W. M. Lv, Z. Q. Liu, S. W. Zeng, M. Motapothula, S. Dhar, Q. Wang, T. Venkatesan
  • AIP Advances, January 2012, American Institute of Physics
  • DOI: 10.1063/1.3682346
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