Observation and simulation of hard x ray photoelectron diffraction to determine polarity of polycrystalline zinc oxide films with rotation domains

Jesse R. Williams, Igor Píš, Masaaki Kobata, Aimo Winkelmann, Tomohiro Matsushita, Yutaka Adachi, Naoki Ohashi, Keisuke Kobayashi
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.3682088