Effect of nickel contamination on high carrier lifetime n-type crystalline silicon

Yohan Yoon, Bijaya Paudyal, Jinwoo Kim, Young-Woo Ok, Prashant Kulshreshtha, Steve Johnston, George Rozgonyi
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.3680880