Contact transport of focused ion beam-deposited Pt to Si nanowires: From measurement to understanding

  • J. J. Ke, K. T. Tsai, Y. A. Dai, J. H. He
  • Applied Physics Letters, January 2012, American Institute of Physics
  • DOI: 10.1063/1.3680251

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http://dx.doi.org/10.1063/1.3680251

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