Observation of weak temperature dependence of spin diffusion length in highly-doped Si by using a non-local 3-terminal method

M. Kameno, E. Shikoh, T. Oikawa, T. Sasaki, T. Suzuki, Y. Suzuki, M. Shiraishi
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.3680096