Optical modeling and experimental verification of light induced phenomena in In-Ga-Zn-O thin film transistors with varying gate insulator thickness

Yoon Jang Chung, Jeong Hwan Kim, Un Ki Kim, Sang Ho Rha, Eric Hwang, Cheol Seong Hwang
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.3679522
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