Probing transconductance spatial variations in graphene nanoribbon field-effect transistors using scanning gate microscopy

  • A. Soudi, G. Aivazian, S.-F. Shi, X. D. Xu, Y. Gu
  • Applied Physics Letters, January 2012, American Institute of Physics
  • DOI: 10.1063/1.3678034

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http://dx.doi.org/10.1063/1.3678034

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