Exchange bias in sputtered FM/BiFeO3 thin films (FM = Fe and Co)

H. W. Chang, F. T. Yuan, C. W. Shih, W. L. Li, P. H. Chen, C. R. Wang, W. C. Chang, S. U. Jen
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.3677801