Loss characterization of Mo-doped FeNi flake for DC-to-DC converter and MHz frequency applications

Yang Zhou, Xiaoming Kou, Mingkai Mu, Brandon M. McLaughlin, Xing Chen, Paul E. Parsons, Hao Zhu, Alex Ji, Fred C. Lee, John Q. Xiao
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.3677310
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