Defect characterization in Mg-doped GaN studied using a monoenergetic positron beam

A. Uedono, S. Ishibashi, K. Tenjinbayashi, T. Tsutsui, K. Nakahara, D. Takamizu, S. F. Chichibu
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.3675516