Current-induced switching of exchange bias in nano-scaled magnetic tunnel junctions with a synthetic antiferromagnetic pinned layer

C. T. Chao, C. Y. Kuo, Lance Horng, M. Tsunoda, M. Takahashi, J. C. Wu
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.3673811