Electric transport through nanometric CoFe2O4 thin films investigated by conducting atomic force microscopy

M. Foerster, D. F. Gutierrez, J. M. Rebled, E. Arbelo, F. Rigato, M. Jourdan, F. Peiró, J. Fontcuberta
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.3672839