Distribution of electronic reconstruction at the n-type LaAlO3/SrTiO3 interface revealed by hard x-ray photoemission spectroscopy

  • Y. Y. Chu, Y. F. Liao, V. T. Tra, J. C. Yang, W. Z. Liu, Y. H. Chu, J. Y. Lin, J. H. Huang, J. Weinen, S. Agrestini, K.-D. Tsuei, D. J. Huang
  • Applied Physics Letters, December 2011, American Institute of Physics
  • DOI: 10.1063/1.3672099

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