Distribution of electronic reconstruction at the n-type LaAlO3/SrTiO3 interface revealed by hard x-ray photoemission spectroscopy

Y. Y. Chu, Y. F. Liao, V. T. Tra, J. C. Yang, W. Z. Liu, Y. H. Chu, J. Y. Lin, J. H. Huang, J. Weinen, S. Agrestini, K.-D. Tsuei, D. J. Huang
  • Applied Physics Letters, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3672099
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