Measurement of valence band structure in boron-zinc-oxide films by making use of ion beams

  • Han S. Uhm, Gi C. Kwon, Eun H. Choi
  • Applied Physics Letters, December 2011, American Institute of Physics
  • DOI: 10.1063/1.3672052

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http://dx.doi.org/10.1063/1.3672052

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