The morphology of Al-based submicron Josephson junction

V. V. Roddatis, U. Hübner, B. I. Ivanov, E. Il’ichev, H.-G. Meyer, M. V. Koval’chuk, A. L. Vasiliev
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3670003