The dielectric relaxation behavior of (Na0.82K0.18)0.5Bi0.5TiO3 ferroelectric thin film

H. Dong, X. J. Zheng, W. Li, Y. Q. Gong, J. F. Peng, Z. Zhu
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3665389