Induced terahertz emission as a probe for semiconductor devices

  • Patrick Hoyer, Gabor Matthäus, Ulrike Blumröder, Kevin Füchsel, Stefan Nolte
  • Applied Physics Letters, November 2011, American Institute of Physics
  • DOI: 10.1063/1.3664769

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http://dx.doi.org/10.1063/1.3664769

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