Photoemission induced bias in two-dimensional silicon pn junctions

  • M. Lavayssière, O. Renault, D. Mariolle, M. Veillerot, J. P. Barnes, J. M. Hartmann, J. Leroy, N. Barrett
  • Applied Physics Letters, November 2011, American Institute of Physics
  • DOI: 10.1063/1.3662440

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http://dx.doi.org/10.1063/1.3662440

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