X-ray diffraction and surface acoustic wave analysis of BST/Pt/TiO2/SiO2/Si thin films

Souhir Mseddi, Anouar Njeh, Dieter Schneider, Hartmut Fuess, Mohamed Hédi Ben Ghozlen
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3662188