A comparative study of Langmuir surfactant films: Grazing incidence x-ray off-specular scattering vs. x-ray specular reflectivity

Yeling Dai, Binhua Lin, Mati Meron, Kyungil Kim, Brian Leahy, Oleg G. Shpyrko
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3661980