In-situ x-ray diffraction studies on post-deposition vacuum-annealing of ultra-thin iron oxide films

F. Bertram, C. Deiter, K. Pflaum, M. Suendorf, C. Otte, J. Wollschläger
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3661655