Surfactant enhanced solid phase epitaxy of Ge/CaF2/Si(111): Synchrotron x-ray characterization of structure and morphology

J. Wollschläger, C. Deiter, C. R. Wang, B. H. Müller, K. R. Hofmann
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3661174
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