Influence of source and drain contacts on the properties of the indium-zinc oxide thin-film transistors based on anodic aluminum oxide gate dielectrics

Linfeng Lan, Miao Xu, Junbiao Peng, Hua Xu, Min Li, Dongxiang Luo, Jianhua Zou, Hong Tao, Lei Wang, Rihui Yao
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3660791
The author haven't yet claimed this publicationThe author haven't yet claimed this publication