InGaN epilayer characterization by microfocused x-ray reciprocal space mapping

  • V. Kachkanov, I. P. Dolbnya, K. P. O’Donnell, R. W. Martin, P. R. Edwards, S. Pereira
  • Applied Physics Letters, October 2011, American Institute of Physics
  • DOI: 10.1063/1.3658619

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http://dx.doi.org/10.1063/1.3658619

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