Gallium gradients in chalcopyrite thin films: Depth profile analyses of films grown at different temperatures

H. Mönig, C. A. Kaufmann, Ch.-H. Fischer, A. Grimm, R. Caballero, B. Johnson, A. Eicke, M. Ch. Lux-Steiner, I. Lauermann
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3656986