Characterization of bias stress induced electrical instability in liquid-crystalline semiconducting polymer thin-film transistors

Jiyoul Lee, Do Hwan Kim, Bang-Lin Lee, Jeong-Il Park, Byungwook Yoo, Joo Young Kim, Hyunsik Moon, Bonwon Koo, Yong Wan Jin, Sangyoon Lee
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3656442
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