Emissivity measurements of shocked tin using a multi-wavelength integrating sphere

A. Seifter, M. Grover, D. B. Holtkamp, A. J. Iverson, G. D. Stevens, W. D. Turley, L. R. Veeser, M. D. Wilke, J. A. Young
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3656429
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