Microstructure dependence of the c-axis critical current density in second-generation YBCO tapes

Y. Jia, U. Welp, G. W. Crabtree, W. K. Kwok, A. P. Malozemoff, M. W. Rupich, S. Fleshler, J. R. Clem
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3653292