Temperature dependence of current density and admittance in metal-insulator-semiconductor junctions with molecular insulator

A. B. Fadjie-Djomkam, S. Ababou-Girard, R. Hiremath, C. Herrier, B. Fabre, F. Solal, C. Godet
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3651401