Kelvin probe force gradient microscopy of charge dissipation in nano thin dielectric layers

M. S. Dunaevskiy, P. A. Alekseev, P. Girard, E. Lahderanta, A. Lashkul, A. N. Titkov
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3651396