Application of transmission electron microscopy for microstructural characterization of perfluoropentacene thin films

Benedikt Haas, Andreas Beyer, Wiebke Witte, Tobias Breuer, Gregor Witte, Kerstin Volz
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3646549
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