Hard x-ray photoelectron spectroscopy study of the buried Si/ZnO thin-film solar cell interface: Direct evidence for the formation of Si–O at the expense of Zn-O bonds

  • M. Wimmer, M. Bär, D. Gerlach, R. G. Wilks, S. Scherf, C. Lupulescu, F. Ruske, R. Félix, J. Hüpkes, G. Gavrila, M. Gorgoi, K. Lips, W. Eberhardt, B. Rech
  • Applied Physics Letters, October 2011, American Institute of Physics
  • DOI: 10.1063/1.3644084

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http://dx.doi.org/10.1063/1.3644084

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